XRD


Fringe XRD
By performing X-ray diffraction on samples of bulk materials such as powders, single crystals or polycrystals, and analyzing their diffraction patterns, information such as the composition of the material, the structure or morphology of atoms or molecules inside the material, etc., is obtained. Powerful method for crystal structure.
FRINGE Benchtop X-Ray diffractometer is a desktop X-Ray diffractometer independently developed by LANScientific Co., LTD., which integrates XRD, XRF, computer software and other technologies. It can quickly conduct qualitative and quantitative analysis, crystal structure analysis, material structure analysis and crystallinity determination for powder, block or thin film and other forms of samples. It has the characteristics of high precision, high accuracy, good stability, wide application range, simple operation and intelligence. For materials research, universities and research institutes, building materials, metals, minerals, plastics, pharmaceuticals, semiconductors and many other fields provide high precision analysis.
ADVANTAGES
ADVANTAGES
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